DIAVITE MICRO VH roughness measuring device for skidded tracers

Name: DIAVITE MICRO VH roughness measuring device for skidded tracers
Brand: DIAVITE
SKU: 47100110

Brand: DIAVITE

Art.-no. 47100110

Manufacturer article no. MICRO/ VH

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DIAVITE MICRO VH roughness measuring device for skidded tracers

Art.-no. 47100110

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Application

Compact, mobile roughness measuring device for standardised roughness measurement in production and measuring rooms.

Execution

Roughness parameters in accordance with DIN ISO, JIS, ASME
including SH standard probe with diamond probe tip 5 µm
with VH internal feed unit for skidded tracers

Advantage

selectable standardised evaluation of parameters in accordance with ISO standard 4287 (withdrawn) and new ISO standard 21920-2:2021
simple and intuitive operation, no training required
Measurements in all directions: horizontal, vertical and overhead

Delivery

Display unit with feed unit, SH 5 µm/90° standard probe, power supply/charger, DIAVITE App light software, roughness standard approx. Ra 3 µm, case

Product information

HAHN+KOLB Catalogue

Certificates/ Documents

Brand	DIAVITE
Manufacturer Part Number	MICRO/ VH
Probe system	Runner probe system
Surface roughness measuring range	20 µm 350 µm
Min./max. scanning path	0.48-16 mm
Measuring range of Z axis	450 µm
Measurement force	0.15 N
Surface roughness sensing speed	0,05 mm/s 1 mm/s
Parameters	Ra Rz Rt Rzmax Rp Rv Rsm Rq Rmax R AR Rx
Threshold wave length	0.08 mm 0.25 mm 0.8 mm 2.5 mm
Data transmission type	USB
Housing dimensions (LxWxH)	150 x 60 x 45 mm
Sensor tip	5 µm
Sensor tip angle	90 Degree
Language	German English French Italian Spanish Polish
Feed unit dimension	136 x 20 x 33 mm
Gross Weight	2.800 kg

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